| 摘要 |
PURPOSE: An array test device is provided to rotate a probe bar on a probe module, thereby easily inspecting and replacing a probe pin. CONSTITUTION: A probe module(23) is adjacent to an electrode of a glass panel. A probe bar(70) is installed in the probe module. The probe bar comprises a plurality of probe pins. The probe pins face the glass panel. The probe bar can rotate to make the probe pin to face in a direction different from a direction in which the probe pin faces the glass panel. |
