发明名称 DAMAGE-FREE HIGH EFFICIENCY PARTICLE REMOVAL CLEAN
摘要 A system, method and an apparatus to remove contaminants from a semiconductor substrate surface includes application of a cleaning material. The cleaning material includes a cleaning solution and a plurality of micron-sized dry polyvinyl particles dispersed in the cleaning solution. The cleaning solution is a single phase polymeric compound that is made of long polymeric chains and exhibits distinct viscoelastic properties. The plurality of micron-sized dry polyvinyl alcohol particles absorb the liquid in the cleaning solution and become uniformly suspended within the cleaning material. The suspended polyvinyl alcohol particles interact with at least some of contaminants on the semiconductor substrate surface to release and remove the contaminants from the substrate surface. The released contaminants are entrapped within the cleaning material and removed with the cleaning material leaving behind a substantially clean substrate surface.
申请公布号 KR20120109999(A) 申请公布日期 2012.10.09
申请号 KR20117030897 申请日期 2010.06.21
申请人 LAM RESEARCH CORPORATION 发明人 MIKHAYLICHENKO KATRINA
分类号 C23G1/00;C23G3/00 主分类号 C23G1/00
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