发明名称 |
CONTACTING APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A connecting device for semiconductor element test is provided to connect all kinds of semiconductor elements to a test device through a hifix board. CONSTITUTION: A connecting device(100) for semiconductor element test comprises a connecting body(200), a plurality of first electrodes(300), a plurality of second electrodes(400), and a connecting member. The connecting body is combined with a hifix board. The plurality of first electrodes is formed so that semiconductor elements having element terminals having different pitch are contactable to the top surface of the connecting body. The plurality of second electrodes is formed so that intermediate terminals of the hifix board for testing electric properties of the semiconductor elements are connected to the bottom surface of the connecting body. The connecting member electrically connects the plurality of first electrodes to the plurality of second electrodes. |
申请公布号 |
KR20120109220(A) |
申请公布日期 |
2012.10.08 |
申请号 |
KR20110027633 |
申请日期 |
2011.03.28 |
申请人 |
SECRON CO., LTD. |
发明人 |
JUNG, BYUNG JIN;KIM, SUN WOON |
分类号 |
G01R1/067;G01R31/26;H01L21/66 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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