发明名称 TESTING APPARATUS
摘要 PURPOSE: A test apparatus is provided to minimize a ripple of voltage using a low-pass filter. CONSTITUTION: A capacitance element is connected between a main terminal(40) and a secondary terminal(42). The capacitance element comprises one or more capacitances. The main terminal and the secondary terminal are respectively connected to a first electronic network and a second electronic network. A first electronic block(46) connects the capacitance element to the main terminal. A second electronic block(48) connects the capacitance element to the secondary terminal. The first electronic block comprises a first module, a second module, and one or more first inductors. The second electronic block comprises a third module and one or more second inductors.
申请公布号 KR20120109379(A) 申请公布日期 2012.10.08
申请号 KR20120029650 申请日期 2012.03.23
申请人 ALSTOM TECHNOLOGY LTD. 发明人 PICKEN DONALD ALASDAIR
分类号 G01R31/42;G01R31/08 主分类号 G01R31/42
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