| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device that is capable of executing, at high frequencies, a disturb test which requires a long time for testing, when a burn-in tester which can supply only clocks with low frequencies is used. <P>SOLUTION: In the semiconductor device, in a test operation mode, a row address that indicates the location of a first word line is fetched from a row address buffer section 12d. A control circuit 18a and a timing control circuit 18b select the first word line and a second word line which is different from the first word line and which shares a pair of bit lines with the first word line, and executes a refresh operation of a memory cell connected to the word lines at a second frequency which is higher than a first frequency of a clock signal supplied from the outside. <P>COPYRIGHT: (C)2013,JPO&INPIT |
