发明名称 ELECTRONIC APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To solve such a problem that anisotropic conductive film (ACF) conductive particles move due to ACF binder flow during ACF thermocompression bonding to cause congestion of the conductive particles between bumps when an IC chip is mounted through the chip on glass (COG) method. <P>SOLUTION: A wall like protrusion is formed on a position on a glass substrate which corresponds to the inner side of output bumps of an IC chip. The wall like protrusion prevents movements of conductive particles due to ACF binder flow during the COG mounting and thereby preventing congestion of the conductive particles. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012191015(A) 申请公布日期 2012.10.04
申请号 JP20110053465 申请日期 2011.03.10
申请人 SEIKO INSTRUMENTS INC 发明人 FUJITA HIROYUKI
分类号 H01L21/60 主分类号 H01L21/60
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