首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
Apparatus for the analysis of the fine structure of material by x-rays
摘要
申请公布号
GB683481(A)
申请公布日期
1952.11.26
申请号
GB19490032177
申请日期
1949.12.15
申请人
CHIRANA;ALOIS DVORAK
发明人
分类号
G01N23/205
主分类号
G01N23/205
代理机构
代理人
主权项
地址
您可能感兴趣的专利
SYSTEM AND METHOD FOR CREATING REAL-TIME APPLICATION SIGNITURE
INTEGRATED PON MAC MATCHING APPARATUS FOR PROVIDING VOICE, DATA AND VIDEO STREAM SERVICES, AND INTEGRATED PON ONT(ONU) APPARATUS USING THAT
PROBE HOLDER FOR MEASURING EMC
APPARATUS AND METHOD FOR PHOTON DETECTION
THE TILE BINDING CEMENT HAVING POLYMER WITH ELASTICITY
OPTICAL MEDIA HAVING GRAPHENE WEAR PROTECTION LAYERS
INFORMATION PROCESSING METHOD, USER TERMINAL, AND BASE STATION
ESTIMATION OF THE FREQUENCY ERROR OF A TONE SIGNAL WITH WIDENED ACQUISITION RANGE
Flotador y estructura flotante
PANEL AISLANTE PARA LA CONSTRUCCION DE CONDUCTOS AUTOPORTANTES DE CALEFACCION, VENTILACION O AIRE ACONDICIONADO Y CONDUCTO AUTOPORTANTE CON DICHO PANEL.
Sistema de moldeo y encaje
Antistaling process for flat bread
Partially saturated tricyclic compounds and methods of making and using same
Analyte test meter
Titanium dioxide free multilayer coating system
Time-temperature indicator system
Flexible microwave catheters for natural or artificial lumens
Power generating device
Tissue penetration device
Wireless Power, Light and Automation Control With Ambient Light and Proximity Detection
