发明名称 Semiconductor device, method for producing the same, sensor and electro-optical device
摘要 A gate electrode, a gate insulation film and an inorganic oxide film are formed in this order on a substrate, and a source electrode and a drain electrode are formed to partially cover the inorganic oxide film. Then, oxidation treatment is applied to reduce the carrier density at a region of the inorganic oxide film which is not covered by the electrodes and is used as a channel region of a semiconductor device.
申请公布号 US8278136(B2) 申请公布日期 2012.10.02
申请号 US20090474931 申请日期 2009.05.29
申请人 TANAKA ATSUSHI;UMEDA KENICHI;HIGASHI KOHEI;NANGU MAKI;FUJIFILM CORPORATION 发明人 TANAKA ATSUSHI;UMEDA KENICHI;HIGASHI KOHEI;NANGU MAKI
分类号 H01L51/40;B05D5/12;C23C14/30;H01L21/00;H01L21/44 主分类号 H01L51/40
代理机构 代理人
主权项
地址