发明名称 MASS SPECTROMETRIC ANALYSIS AND MASS SPECTROMETER
摘要 <P>PROBLEM TO BE SOLVED: To make quantitative determination while correcting variation in ionization efficiency and a quantity of a measurement target to be introduced into an ion trap. <P>SOLUTION: Ions of a reference material and ions of a measurement target are simultaneously trapped by an ion trap, so as to quantitatively determine a concentration of the measurement target on the basis of signal intensity of the ions of the reference material discharged selectively by mass and signal intensity of fragment ions of the measurement target. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012184975(A) 申请公布日期 2012.09.27
申请号 JP20110047101 申请日期 2011.03.04
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 SUGIYAMA MASUYUKI;HASHIMOTO YUICHIRO;HASEGAWA HIDEKI;HASHIBA SHUHEI;KUMANO SHUN
分类号 G01N27/62;H01J49/04;H01J49/42 主分类号 G01N27/62
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