METHOD AND SYSTEM FOR THE DIRECTIONAL DETECTION OF ELECTRONS IN A SCANNING ELECTRON MICROSCOPE,申请号EP20040775186-传众专利搜索

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发明名称	METHOD AND SYSTEM FOR THE DIRECTIONAL DETECTION OF ELECTRONS IN A SCANNING ELECTRON MICROSCOPE
摘要
申请公布号	EP1706887(B1)	申请公布日期	2012.09.26
申请号	EP20040775186	申请日期	2004.10.06
申请人	POLITECHNIKA WROCLAWSKA	发明人	SLOWKO, WITOLD
分类号	H01J37/244	主分类号	H01J37/244
代理机构		代理人
主权项
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