发明名称 Image sensor pixels with vertical charge transfer
摘要 Image sensors having image sensor pixels with stacked photodiodes are provided. An image sensor pixel may include a shallow potential well located in a shallow implant region and a deep potential well located in a deep implant region. The shallow implant region and the deep implant region may be separated by a potential barrier. The image sensor pixel may have a given transfer gate to transfer charge from the shallow well to a floating diffusion node. The image sensor pixel may have an additional transfer gate to transfer charge from the deep well to the shallow well via a vertical transfer region located under the additional transfer gate. Image sensor pixels formed using this structure may exhibit higher pixel densities, higher image resolution, and higher sensitivity.
申请公布号 US8274587(B2) 申请公布日期 2012.09.25
申请号 US20100758995 申请日期 2010.04.13
申请人 HYNECEK JAROSLAV;APTINA IMAGING CORPORATION 发明人 HYNECEK JAROSLAV
分类号 H04N9/083;H01L31/062;H01L31/113;H04N3/14;H04N5/335;H04N9/04 主分类号 H04N9/083
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