发明名称 |
Image sensor pixels with vertical charge transfer |
摘要 |
Image sensors having image sensor pixels with stacked photodiodes are provided. An image sensor pixel may include a shallow potential well located in a shallow implant region and a deep potential well located in a deep implant region. The shallow implant region and the deep implant region may be separated by a potential barrier. The image sensor pixel may have a given transfer gate to transfer charge from the shallow well to a floating diffusion node. The image sensor pixel may have an additional transfer gate to transfer charge from the deep well to the shallow well via a vertical transfer region located under the additional transfer gate. Image sensor pixels formed using this structure may exhibit higher pixel densities, higher image resolution, and higher sensitivity. |
申请公布号 |
US8274587(B2) |
申请公布日期 |
2012.09.25 |
申请号 |
US20100758995 |
申请日期 |
2010.04.13 |
申请人 |
HYNECEK JAROSLAV;APTINA IMAGING CORPORATION |
发明人 |
HYNECEK JAROSLAV |
分类号 |
H04N9/083;H01L31/062;H01L31/113;H04N3/14;H04N5/335;H04N9/04 |
主分类号 |
H04N9/083 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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