发明名称 Isolation trench with rounded corners for BiCMOS process
摘要 A semiconductor device comprising a first transistor device (130) on or in a semiconductor substrate (115) and a second transistor device (132) on or in the substrate. The device further comprises an insulating trench (200) located between the first transistor device and the second transistor device. At least one upper corner (610) of the insulating trench is a rounded corner in a lateral plane (620) of the substrate.
申请公布号 US8274131(B2) 申请公布日期 2012.09.25
申请号 US20100962159 申请日期 2010.12.07
申请人 PENDHARKAR SAMEER P.;LIN JOHN;HOWER PHILIP L.;MERCHANT STEVEN L.;TEXAS INSTRUMENTS INCORPORATED 发明人 PENDHARKAR SAMEER P.;LIN JOHN;HOWER PHILIP L.;MERCHANT STEVEN L.
分类号 H01L21/70 主分类号 H01L21/70
代理机构 代理人
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