发明名称 SELF-DIAGNOSIS CIRCUIT AND SELF-DIAGNOSIS METHOD
摘要 <P>PROBLEM TO BE SOLVED: To reduce the execution time of self-diagnosis of a microcomputer. <P>SOLUTION: A self-diagnosis circuit includes: means for determining whether an operation after reset is hot start or cold start; means for storing association information indicating which ones of function blocks are influenced by an error generated in each function block, and for determining which one of the blocks has the error generated in a normal operation, and for selecting the function block which executes BIST from a plurality of function blocks; and means for controlling the order of the execution of the BIST of the selected function block on the basis of the association information, and for instructing the execution of the BIST. The self-diagnosis circuit is configured to, when it is determined that the operation after reset is hot start, select the function block which executes the BIST, and to execute the BIST by controlling the order of the execution of the BIST of the selected function block on the basis of the association information, and to, when it is determined that the operation after start is cold start, execute the BIST of all of the plurality of function blocks. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012181564(A) 申请公布日期 2012.09.20
申请号 JP20110041968 申请日期 2011.02.28
申请人 RENESAS ELECTRONICS CORP 发明人 SASAHARA KOKI
分类号 G06F11/22;G01R31/28;G06F15/78 主分类号 G06F11/22
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