发明名称 |
Method for providing form filter for use in X-ray image pickup device e.g. X-ray computed tomography, involves determining corresponding thickness of form filter using determined thickness of image object based on size of beam |
摘要 |
<p>The method involves defining a position of the image object (O) so that the thickness (x) of image object and thickness (b) of form filter (Ff) is assigned corresponding to the beam (S) from an X-ray source (Q). The size of the beam is defined. The selected beams from the X-ray source are emanated in desired condition. The corresponding thickness of the form filter is determined using a determined thickness of the image object based on the size of beam. The form filter with specific thicknesses is provided. An independent claim is included for form filter.</p> |
申请公布号 |
DE102011005810(A1) |
申请公布日期 |
2012.09.20 |
申请号 |
DE20111005810 |
申请日期 |
2011.03.18 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
DENNERLEIN, FRANK, DR.;RUEHRNSCHOPF, ERNST-PETER |
分类号 |
G01N23/04;A61B6/00;A61B6/03;G21K1/10 |
主分类号 |
G01N23/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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