发明名称 Method for providing form filter for use in X-ray image pickup device e.g. X-ray computed tomography, involves determining corresponding thickness of form filter using determined thickness of image object based on size of beam
摘要 <p>The method involves defining a position of the image object (O) so that the thickness (x) of image object and thickness (b) of form filter (Ff) is assigned corresponding to the beam (S) from an X-ray source (Q). The size of the beam is defined. The selected beams from the X-ray source are emanated in desired condition. The corresponding thickness of the form filter is determined using a determined thickness of the image object based on the size of beam. The form filter with specific thicknesses is provided. An independent claim is included for form filter.</p>
申请公布号 DE102011005810(A1) 申请公布日期 2012.09.20
申请号 DE20111005810 申请日期 2011.03.18
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 DENNERLEIN, FRANK, DR.;RUEHRNSCHOPF, ERNST-PETER
分类号 G01N23/04;A61B6/00;A61B6/03;G21K1/10 主分类号 G01N23/04
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