半导体元件的测试方法与系统,申请号TW096149075-传众专利搜索

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发明名称	半导体元件的测试方法与系统
摘要	一种半导体元件的测试方法，系提供至少一半导体元件，而半导体元件上具有复数个单元，每个单元皆有各自单元状态；接着进行半导体元件的测试，根据测试结果定义半导体元件的边界单元，边界单元状态与预先设定值进行比较，决定是否发出讯息，用以提示操作人员可能有地图偏移的情形
申请公布号	TWI372432	申请公布日期	2012.09.11
申请号	TW096149075	申请日期	2007.12.20
申请人	京元电子股份有限公司新竹市公道五路2段81号	发明人	李明聪
分类号	H01L21/66	主分类号	H01L21/66
代理机构		代理人	陈培道新竹县竹东镇中兴路4段195号53馆219室;庄婷聿新竹县竹东镇中兴路4段195号53馆219室
主权项
地址	新竹市公道五路2段81号

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