发明名称 METHOD AND DEVICE FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>A mask layer is formed by: a step in which a first photoresist layer is formed, exposed, and developed on a substrate, thereby forming a first photoresist pattern; a step in which the first photoresist pattern is made insoluble; a step in which a second photoresist layer is formed, exposed, and developed on top of the first photoresist layer, thereby forming a second photoresist pattern that intersects the first photoresist pattern; a step in which the second photoresist pattern is made insoluble; and a step in which a third photoresist layer is formed, exposed, and developed on top of the first and second photoresist patterns, thereby forming a third photoresist pattern.</p>
申请公布号 KR20120099529(A) 申请公布日期 2012.09.10
申请号 KR20127021175 申请日期 2011.02.17
申请人 TOKYO ELECTRON LIMITED 发明人 OYAMA KENICHI
分类号 H01L21/027 主分类号 H01L21/027
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