发明名称 SEMICONDUCTOR SUBSTRATE SURFACE ETCHING DEVICE, AND METHOD OF MANUFACTURING SEMICONDUCTOR SUBSTRATE WHEREON UNEVEN SHAPES ARE FORMED UPON SURFACE THEREOF USING SAID DEVICE
摘要 <p>The present invention addresses a problem of providing a device which etches a semiconductor substrate surface in a manner which is adaptable to mass production while using a gas which reacts thermally with the semiconductor substrate as an etching gas. A semiconductor substrate surface etching device comprises: a load lock chamber; an etching chamber which can be depressurized to less than or equal to atmospheric pressure; an unload lock chamber; a conveyance mechanism for conveying a tray housing a semiconductor substrate from the load lock chamber through the etching chamber to the unload lock chamber; and a cooling mechanism which cools the semiconductor substrate and/or the tray. The surface etching device has a plurality of nozzles in the etching chamber which discharge etching gas toward the surface of the semiconductor substrate which is housed in the tray.</p>
申请公布号 WO2012117696(A1) 申请公布日期 2012.09.07
申请号 WO2012JP01209 申请日期 2012.02.22
申请人 PANASONIC CORPORATION;ARAI, KOUJI;TANABE, HIROSHI;TANIGUCHI, YASUSHI 发明人 ARAI, KOUJI;TANABE, HIROSHI;TANIGUCHI, YASUSHI
分类号 H01L21/302;H01L21/677 主分类号 H01L21/302
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