发明名称 METHODS FOR CONTACT CLEAN
摘要 Methods and apparatus for removing oxide from a surface, the surface comprising at least one of silicon and germanium, are provided. The method and apparatus are particularly suitable for removing native oxide from a metal silicide layer of a contact structure. The method and apparatus advantageously integrate both the etch stop layer etching process and the native oxide removal process in a single chamber, thereby eliminating native oxide growth or other contaminates redeposit during the substrate transfer processes. Furthermore, the method and the apparatus also provides the improved three-step chemical reaction process to efficiently remove native oxide from the metal silicide layer without adversely altering the geometry of the contact structure and the critical dimension of the trenches or vias formed in the contact structure.
申请公布号 US2012225558(A1) 申请公布日期 2012.09.06
申请号 US201213411398 申请日期 2012.03.02
申请人 CHANG MEI;THANH LINH;ZHENG BO;SUNDARRAJAN ARVIND;FORSTER JOHN C.;KELLKAR UMESH M.;NARASIMHAN MURALI;APPLIED MATERIALS, INC 发明人 CHANG MEI;THANH LINH;ZHENG BO;SUNDARRAJAN ARVIND;FORSTER JOHN C.;KELLKAR UMESH M.;NARASIMHAN MURALI
分类号 H01L21/311;H01L21/3105 主分类号 H01L21/311
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