发明名称 DETECTION MATRIX WITH IMPROVED BIASING CONDITIONS AND FABRICATION METHOD
摘要 The detection device includes a semiconductor substrate of a first conductivity type. A matrix of photodiodes organized along a first organization axis is formed on the substrate. Each photodiode is at least partially formed in the substrate. A peripheral biasing ring is formed around the photodiode matrix. The biasing ring is connected to a bias voltage generator. An electrically conducting contact is connected to the substrate and arranged between two photodiodes on the first organization axis. The distance separating the contact from each of the two photodiodes is equal to the distance separating two adjacent photodiodes along the first organization axis. The contact is connected to the bias voltage generator.
申请公布号 US2012223404(A1) 申请公布日期 2012.09.06
申请号 US201213410937 申请日期 2012.03.02
申请人 MAILLART PATRICK;CHABUEL FABIEN;SOCIETE FRANCAISE DE DETECTEURS INFRAROUGES - SOFRADIR 发明人 MAILLART PATRICK;CHABUEL FABIEN
分类号 H01L31/00;H01L31/18 主分类号 H01L31/00
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