发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING METHOD, AND SUBSTRATE PROCESSING APPARATUS |
摘要 |
<P>PROBLEM TO BE SOLVED: To form a silicon nitride film in which silicon is too much against nitride in stoichiometric term. <P>SOLUTION: The method of manufacturing a semiconductor includes a step for forming a silicon nitride film on a substrate in which silicon is too much against nitride in stoichiometric manner by repeating following cycles by a plurality of times, as one cycle: a step in which a silicon-contained material is supplied to a substrate in a process chamber, and then the silicon-contained material is thermally decomposed so that a silicon film having several atom layers or less are deposited on the substrate; a step for removing a silicon-contained material remaining in the process chamber out of the process chamber; a step in which a nitrogen-contained material is supplied to the substrate in the process chamber, and under the condition in which a nitriding reaction with the nitrogen-contained material of the silicon film becomes unsaturated, the silicon film is thermally nitrided; and a step for removing the nitrogen-contained material remaining in the process chamber out of the process chamber. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012169645(A) |
申请公布日期 |
2012.09.06 |
申请号 |
JP20120086385 |
申请日期 |
2012.04.05 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
HIROSE YOSHIRO;TAKAZAWA HIROMASA;KATO TOMOHIDE;AKAE HISANORI |
分类号 |
H01L21/318;C23C16/42;C23C16/455 |
主分类号 |
H01L21/318 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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