发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING METHOD, AND SUBSTRATE PROCESSING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To form a silicon nitride film in which silicon is too much against nitride in stoichiometric term. <P>SOLUTION: The method of manufacturing a semiconductor includes a step for forming a silicon nitride film on a substrate in which silicon is too much against nitride in stoichiometric manner by repeating following cycles by a plurality of times, as one cycle: a step in which a silicon-contained material is supplied to a substrate in a process chamber, and then the silicon-contained material is thermally decomposed so that a silicon film having several atom layers or less are deposited on the substrate; a step for removing a silicon-contained material remaining in the process chamber out of the process chamber; a step in which a nitrogen-contained material is supplied to the substrate in the process chamber, and under the condition in which a nitriding reaction with the nitrogen-contained material of the silicon film becomes unsaturated, the silicon film is thermally nitrided; and a step for removing the nitrogen-contained material remaining in the process chamber out of the process chamber. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012169645(A) 申请公布日期 2012.09.06
申请号 JP20120086385 申请日期 2012.04.05
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 HIROSE YOSHIRO;TAKAZAWA HIROMASA;KATO TOMOHIDE;AKAE HISANORI
分类号 H01L21/318;C23C16/42;C23C16/455 主分类号 H01L21/318
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