| 摘要 |
<p>Disclosed is a concept for testing a device-under-test (130), the concept comprising receiving, from at least one test channel integrated circuit (240-n) dedicated to communicate with an input or output pin of the device-under-test (130) by means of at least one hardware resource (615; 616), at least one logical control command (U-CTRL-n) describing a desired operation of the at least one hardware resource (150), and converting, by means of a resource control means (260), the at least one logical control command (U-CTRL-n) into at least one dedicated control command (D-CTRL-n) for the at least one hardware resource, wherein the at least one dedicated control command (D-CTRL-n) is adapted to a physical implementation of the at least one hardware resource (615; 616).</p> |
