发明名称 POLISHING PAD
摘要 To provide a polishing pad (14) useful for polishing semiconductor materials having a high hardness. The polishing pad (14) is used for polishing a workpiece (16) in combination with loose grains and comprises a polishing surface (15) comprising a textile of high-tenacity organic fibers, the fiber has a tenacity of not lower than 15 cN/dtex. In the textile, the high-tenacity organic fiber may have a single fiber fineness within the range between 0.3 dtex and 15 dtex, or a total fineness of within the range between 3 dtex and 3,000 dtex. The fiber may include, for example, a fully-aromatic polyester fiber.
申请公布号 KR20120096476(A) 申请公布日期 2012.08.30
申请号 KR20127010969 申请日期 2010.09.28
申请人 MARUISHI SANGYO CO., LTD.;KURARAY CO., LTD. 发明人 KATAYAMA TAKASHI;WATANABE TETSUYA;GOTO YUKIO;KATO SHINYA;YAJIMA TOSHIYASU
分类号 H01L21/304;B24B37/04;B24B37/24 主分类号 H01L21/304
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