发明名称 SLURRY COMPOSITION FOR CMP, AND POLISHING METHOD
摘要 <p>The present invention relates to a CMP slurry composition comprising an abrasive particle; a dispersant; an ionic polymer additive; and a non-ionic polymer additive including a polyolefin-polyethylene glycol copolymer including at least two polyethylene glycol repeat unit as a backbone and at least a polyethylene glycol repeating unit as a side chain, and a polishing method with using the slurry composition. The CMP slurry composition shows a low polishing rate to a single-crystalline silicon layer or a polysilicon layer and a high polishing rate to a silicon oxide layer, resulting in having an excellent polishing selectivity.</p>
申请公布号 EP2489714(A2) 申请公布日期 2012.08.22
申请号 EP20100825143 申请日期 2010.10.13
申请人 LG CHEM, LTD. 发明人 SHIN, DONG-MOK;CHOI, EUN-MI;CHO, SEUNG-BEOM
分类号 C09K3/14;C09G1/02;H01L21/304 主分类号 C09K3/14
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