发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A method for manufacturing a semiconductor device is provided to form patterns having different width at the same time by a sidewall mask process. CONSTITUTION: Work-pieces(11, 12) are formed on a semiconductor substrate(10). A core(13) including a first portion and a second portion is formed on the work-pieces. A coating material coats the upper side and side of the core and has a lamination layer including a first layer and a second layer. A first sidewall mask is formed at the side of the first portion of the core and a second sidewall mask is formed at the side of the second portion of the core by etching the coating material. The core is eliminated. Patterns having different width are formed by etching the wore-pieces.</p>
申请公布号 KR20120093054(A) 申请公布日期 2012.08.22
申请号 KR20110093131 申请日期 2011.09.15
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SUDO GAKU
分类号 H01L21/027;H01L21/8239;H01L27/105 主分类号 H01L21/027
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