发明名称 CONNECTION STRUCTURE
摘要 <P>PROBLEM TO BE SOLVED: To provide a connection structure in which the connection reliability of first and second connection target members is high and the conduction reliability between electrodes is also high. <P>SOLUTION: A connection structure 1 according to the invention comprises: a first connection target member 2 having an electrode 2b on its top surface 2a; a second connection target member 4 having an electrode 4b on its undersurface 4a; and a cured material layer 3 which is interposed between the top surface 2a of the first connection target member 2 and the undersurface 4b of the second connection target member 4 and which is formed by curing an adhesive agent. A fillet by the cured material layer 3 is formed in at least a part of the area outside of the outer peripheral side surface of the second connection target member 4. The cured material layer 3 includes a first cured material layer part 3a on the first connection target member 2 side and a second cured material layer part 3b on the second connection target member 4 side. The modulus of elasticity at 25&deg;C of the first cured material layer part 3a is higher than the modulus of elasticity at 25&deg;C of the second cured material layer part 3b. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012156230(A) 申请公布日期 2012.08.16
申请号 JP20110012795 申请日期 2011.01.25
申请人 SEKISUI CHEM CO LTD 发明人 ISHIZAWA HIDEAKI;KUBOTA TAKASHI;KOBAYASHI HIROSHI
分类号 H01L21/60;C09J9/02;C09J201/00;H01R11/01 主分类号 H01L21/60
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