发明名称 |
BACKSCATTER ENERGY ANALYSIS FOR CLASSIFICATION OF MATERIALS BASED ON POSITIONAL NON-COMMUTATIVITY |
摘要 |
A system and methods for characterizing regions within, or on, an inspected object, wherein a lower-Z scattering material and a higher-Z material both lie along a common line of sight. The inspected object is scanned with penetrating radiation characterized by an energy distribution, and penetrating radiation scattered by the inspected object is detected in a manner that generates a first detector signal that distinguishes between materials of higher and lower effective atomic number under a first set of conditions with respect to the energy distribution of the penetrating radiation and a second detector signal that distinguishes between materials of higher and lower effective atomic number under a second set of conditions with respect to the energy distribution of the penetrating radiation. An image is generated, based on a function of the first detector signal and the second detector signal, while the first and the second detector signals are also combined to create a differential image, so as to allow distinction of higher-Z and lower-Z materials. |
申请公布号 |
WO2012109307(A1) |
申请公布日期 |
2012.08.16 |
申请号 |
WO2012US24248 |
申请日期 |
2012.02.08 |
申请人 |
AMERICAN SCIENCE AND ENGINEERING, INC.;ROTHSCHILD, PETER;ZHANG, MING |
发明人 |
ROTHSCHILD, PETER;ZHANG, MING |
分类号 |
G01N23/203 |
主分类号 |
G01N23/203 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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