发明名称 ACTINIC-RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, AND RESIST FILM AND PATTERN FORMING METHOD USING THE SAME COMPOSITION
摘要 An object of the present invention is to provide an actinic-ray-sensitive or radiation-sensitive resin composition which is significantly excellent in terms of exposure latitude, is capable of forming a favorable rectangular pattern profile, and exhibits low dissolution of the components into an immersion liquid when performing immersion exposure, and a resist film and a pattern forming method each using the same composition. The actinic-ray-sensitive or radiation-sensitive resin composition contains (A) a compound represented by formula (I) and capable of generating an acid upon irradiation of actinic-rays or radiations, and (B) a resin capable of increasing the solubility in an alkaline developer by the action of an acid.
申请公布号 US2012207978(A1) 申请公布日期 2012.08.16
申请号 US201213369528 申请日期 2012.02.09
申请人 SHIBUYA AKINORI;YAMAGUCHI SHUHEI;KODAMA KUNIHIKO;WADA KENJI;MATSUDA TOMOKI;FUJIFILM CORPORATION 发明人 SHIBUYA AKINORI;YAMAGUCHI SHUHEI;KODAMA KUNIHIKO;WADA KENJI;MATSUDA TOMOKI
分类号 G03F7/20;B32B3/30;G03F7/004 主分类号 G03F7/20
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