发明名称 Technique for identifying at least one faulty light emitting diode in a string of light emitting diodes
摘要 <p>A method includes receiving a first voltage from an intermediate node (118) in a string (104) of multiple light emitting diodes (LEDs) (102). The method also includes receiving at least one second voltage based on a string voltage (V LED ) across the string of LEDs. The method further includes identifying whether at least one of the LEDs has a fault using the first voltage and the at least one second voltage. The second voltage could be a single reference voltage, and a difference between the first voltage and the reference voltage could be compared to a threshold. Multiple second voltages could define a voltage range that includes a reference voltage, and a determination could be made whether the first voltage falls within the voltage range.</p>
申请公布号 EP2487998(A1) 申请公布日期 2012.08.15
申请号 EP20110305129 申请日期 2011.02.09
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 AVENEL, JEAN-JACQUES
分类号 H05B37/03;H05B33/08 主分类号 H05B37/03
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