| 摘要 |
PURPOSE: A socket for testing a semiconductor chip is provided to couple a plunger with the top of a conductive elastic unit, thereby preventing abrasion of the conductive elastic unit. CONSTITUTION: A non conductive elastic member includes a plurality of conductive elastic units(20). A plurality of plungers(30) is placed among the conductive elastic units and connection terminals. The plungers are coupled with the tops of the conductive elastic units. A location determining groove unit(39) is placed between the conductive elastic units and the plungers. The location determining groove unit determines the locations of the plungers by interacting with a location determining protrusion unit. |
