发明名称 |
METHOD FOR POLISHING SEMICONDUCTOR WAFER, AND DEVICE FOR POLISHING SEMICONDUCTOR WAFER |
摘要 |
PURPOSE: An apparatus and a method for polishing a semiconductor wafer are provided to assume the progress of the polishing of the wafer from the change of the calculated standard deviation by calculating the standard deviation of a plate load current value at every regular time. CONSTITUTION: An upper plate(2) is formed to move vertically by a lifting driving part(7). The lifting driving part is controlled by a command signal from a controller(20). A lower plate(3) includes a rotary shaft(3a) rotated by a lower rotation driving part(8b). Polishing pads(4,5) are respectively formed on the upper plate and the lower plate to face each other for polishing the both sides of a wafer(W). A number of carriers(6a) supporting a number of wafers are arranged between the upper plate and the lower plate.
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申请公布号 |
KR20120088499(A) |
申请公布日期 |
2012.08.08 |
申请号 |
KR20110085947 |
申请日期 |
2011.08.26 |
申请人 |
COVALENT MATERIALS CORPORATION |
发明人 |
HIRASAWA MANABU;UETA SHINICHI;SHIGAKI YASUYO |
分类号 |
H01L21/304;H01L21/66 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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