<p>The invention relates to the field of intensity measurements of a light scattering label bound to a surface of a support using an optical evanescent field. According to the invention, the method comprises the steps: a) Providing an assay comprising at least one light scattering label bound to a surface of a support by at least one bond; b) Measuring the fluctuations in the intensity of scattered light of the label in an optical evanescent field over time while the label is bound to the surface. The method according to the invention allows to identify different bonds and/or to distinguish between different bonds.</p>
申请公布号
EP2483688(A1)
申请公布日期
2012.08.08
申请号
EP20100760058
申请日期
2010.09.07
申请人
KONINKLIJKE PHILIPS ELECTRONICS N.V.
发明人
VAN OMMERING, KIM;SCHLEIPEN, JOHANNES, J. H. B.;NIEUWENHUIS, JEROEN, H.