发明名称 PROBE AND MAGNETIC FORCE MICROSCOPE
摘要 <P>PROBLEM TO BE SOLVED: To provide a probe having a higher coercive force compared with that of the conventional one, and a magnetic force microscope. <P>SOLUTION: In a probe 2 with a sharp part 40, the sharp part 40 is provided with a magnetic material 42 including an epsilon-type iron oxide compound. Since the epsilon-type iron oxide compound has a coercive force of about 20kOe, the probe 2 having a significantly higher coercive force compared with that of the conventional one can be provided. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012145567(A) 申请公布日期 2012.08.02
申请号 JP20110262329 申请日期 2011.11.30
申请人 UNIV OF TOKYO;SII NANOTECHNOLOGY INC 发明人 OGOSHI SHINICHI;IKUI ASUKA;TOKORO YUKO;YAMAOKA TAKEHIRO
分类号 G01Q60/54;G01Q80/00 主分类号 G01Q60/54
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