发明名称 CHARGE-INTEGRATION MULTILINEAR IMAGE SENSOR
摘要 The invention relates to time-delay and signal-integration linear image sensors (or TDI sensors). According to the invention, a pixel comprises a succession of several insulated gates covering a semiconducting layer, the gates of one pixel being separated from one another and separated from the gates of an adjacent pixel of another line by narrow uncovered gaps of a gate and comprising a doped region of a second type of conductivity covered by a doped superficial region of the first type; the superficial regions are kept at one and the same reference potential; the width of the narrow gaps between adjacent gates is such that the internal potential of the region of the second type is modified in the whole width of the narrow gap when a gate sustains the alternations of potential necessary for the transfer of charges from one pixel to the following one.
申请公布号 US2012193683(A1) 申请公布日期 2012.08.02
申请号 US201213359200 申请日期 2012.01.26
申请人 E2V SEMICONDUCTORS 发明人 MAYER FREDERIC
分类号 H01L27/148 主分类号 H01L27/148
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