| 摘要 |
<p>The method involves measuring an upper surface topography using a white light interferometer. Thickness of a transparent layer (17) i.e. carbon coated metal upper surface, is measured according to a principle of a reflecto-meter, and a radiation source (11) with an electromagnetic radiation spectrum is utilized for the measuring both the upper surface topography and thickness of the transparent layer. The radiation spectrum is reflected in a wavelength range of a coated upper surface included in the radiation spectrum and ingresses in another wavelength range of the radiation spectrum. An independent claim is also included for an optical measuring device for determining an upper surface topography of a coated object and for determining a thickness of a transparent layer on the coated object, comprising a radiation source.</p> |
