发明名称 DECIDING METHOD OF THE SUITABILITY OF DETERMINING STANDARD VALUES AND APPROPRIATE VALUE OF THE SAME, INSPECTION SYSTEM OF PART MOUNTING SUBSTRATE, SIMULATION METHOD AT PRODUCTION LINE AND SIMULATION SYSTEM
摘要 PURPOSE: A method for determining adequacy of a determination reference value and a method for measuring an appropriate value thereof, an inspection system of a part mounting substrate, a simulation method at a production line and a simulation system thereof are provided to precisely perform a simulation process by using a preset value inputted as a determination reference value of an intermediate inspection. CONSTITUTION: A plurality of samples is set by performing a measuring process to obtain a feature amount of an inspection object. Correlation between a measured value about an intermediate product and the measured value about a final product is drawn. A matched degree of an intermediate inspection result and a final inspection result and an unmatched degree of each inspection result are obtained. Suitability of the determination reference value used for the intermediate inspection is determined.
申请公布号 KR20120083832(A) 申请公布日期 2012.07.26
申请号 KR20110105012 申请日期 2011.10.14
申请人 OMRON CORPORATION 发明人 MORI HIROYUKI;NAKAJIMA KATSUKI;TASAKI HIROSHI
分类号 H05K3/34;H05K13/08 主分类号 H05K3/34
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