发明名称 |
DECIDING METHOD OF THE SUITABILITY OF DETERMINING STANDARD VALUES AND APPROPRIATE VALUE OF THE SAME, INSPECTION SYSTEM OF PART MOUNTING SUBSTRATE, SIMULATION METHOD AT PRODUCTION LINE AND SIMULATION SYSTEM |
摘要 |
PURPOSE: A method for determining adequacy of a determination reference value and a method for measuring an appropriate value thereof, an inspection system of a part mounting substrate, a simulation method at a production line and a simulation system thereof are provided to precisely perform a simulation process by using a preset value inputted as a determination reference value of an intermediate inspection. CONSTITUTION: A plurality of samples is set by performing a measuring process to obtain a feature amount of an inspection object. Correlation between a measured value about an intermediate product and the measured value about a final product is drawn. A matched degree of an intermediate inspection result and a final inspection result and an unmatched degree of each inspection result are obtained. Suitability of the determination reference value used for the intermediate inspection is determined. |
申请公布号 |
KR20120083832(A) |
申请公布日期 |
2012.07.26 |
申请号 |
KR20110105012 |
申请日期 |
2011.10.14 |
申请人 |
OMRON CORPORATION |
发明人 |
MORI HIROYUKI;NAKAJIMA KATSUKI;TASAKI HIROSHI |
分类号 |
H05K3/34;H05K13/08 |
主分类号 |
H05K3/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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