| 摘要 |
<P>PROBLEM TO BE SOLVED: To precisely distinguish the formation noise of a metal specimen and a detection signal due to a scab defect. <P>SOLUTION: A surface layer defect detection device includes a plurality of E-type sensors 5 arranged in the direction orthogonal to the conveyance direction of the metal specimen 4. This device also includes: two-dimensional imaging means 18 which prepares a two-dimensional map of the detection signal by mapping the detection signals of respective eddy current flaw detection sensors on a two-dimensional plane including the conveyance direction of the metal specimen 4 and the arrangement direction of the E-type sensors 5; and discriminating means 17 which discriminates whether or not the scab defect exists in the surface layer of the metal specimen 4 based on a two-dimensional pattern of the detection signal in the two-dimensional map. <P>COPYRIGHT: (C)2012,JPO&INPIT |
