发明名称 BUILT-IN TEST FOR AN OVERVOLTAGE PROTECTION CIRCUIT
摘要 An overvoltage protection circuit connected to protect electrical components from overvoltage conditions includes a blocking diode connected in series with a transient voltage suppression device (TVS) via a first node and includes a reference voltage for biasing the first node at a voltage sufficient to reverse bias the blocking diode during normal operations. A built-in test circuit associated with the overvoltage protection circuit includes a resistor connected to the first node and a switch connected in series with the resistor that is selectively turned On and Off. The built-in test circuit monitors voltage on a control line associated with the electrical components and at the first node while the switch is Off and while the switch is On, and detects fault conditions based on the monitored voltages.
申请公布号 US2012187969(A1) 申请公布日期 2012.07.26
申请号 US201113013292 申请日期 2011.01.25
申请人 HESS GARY L.;HAMILTON SUNDSTRAND CORPORATION 发明人 HESS GARY L.
分类号 G01R31/3187;G01R31/02 主分类号 G01R31/3187
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