发明名称 |
Apparatus for measuring IQ imbalance |
摘要 |
The present invention relates to an apparatus and a method for measuring an in phase and quadrature (IQ) imbalance. One embodiment according to the present general inventive concept can provide a method for measuring a Tx IQ imbalance generated in an IQ up-conversion mixer and an Rx IQ imbalance generated in an IQ down-conversion mixer, that includes measuring a first IQ imbalance corresponding to a first combination of the Rx IQ imbalance with the Tx IQ imbalance, measuring a second IQ imbalance corresponding to a second combination of the Rx IQ imbalance with the Tx IQ imbalance and obtaining the Tx IQ imbalance and the Rx IQ imbalance from the first IQ imbalance and the second IQ imbalance. |
申请公布号 |
US8229028(B2) |
申请公布日期 |
2012.07.24 |
申请号 |
US20080034627 |
申请日期 |
2008.02.20 |
申请人 |
LEE KYEONGHO;PARK JOONBAE;LEE JEONG WOO;LEE SEUNG-WOOK;LEE EAL WAN;GCT SEMICONDUCTOR, INC. |
发明人 |
LEE KYEONGHO;PARK JOONBAE;LEE JEONG WOO;LEE SEUNG-WOOK;LEE EAL WAN |
分类号 |
H04K1/02 |
主分类号 |
H04K1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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