发明名称 |
METHOD OF FORMING PHOTOMASK USING CALIBRATION PATTERN, AND PHOTOMASK HAVING CALIBRATION PATTERN |
摘要 |
PURPOSE: A photo-mask and a method for manufacturing the same are provided to precisely produce an MTT(Mean-To-Target) dimension and uniformity of a two-dimensional pattern at the same time by accurately transferring a desire pattern on a substrate. CONSTITUTION: One-dimensional calibration measured patterns are obtained from one-dimensional calibration design patterns and two-dimensional calibration measured patterns are obtained from two-dimensional calibration design patterns(S20). First measured dimensions of the one-dimensional calibration measured patterns are obtained and second measured dimensions of the two-dimensional calibration measured patterns are obtained(S30). A correlation between the first measured dimensions and the second measured dimensions is established(S40). A main measured dimension of a main pattern is changed into the first measured dimension by using the correlation(S50). |
申请公布号 |
KR20120081659(A) |
申请公布日期 |
2012.07.20 |
申请号 |
KR20100129997 |
申请日期 |
2010.12.17 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
YOON, YOUNG KEUN;KIM, HEE BOM;LEE, MYOUNG SOO;JEON, CHAN UK;HAN, HAK SEUNG |
分类号 |
H01L21/027;G03F1/68;G03F1/76 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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