| 摘要 |
Provided are a particle measurement apparatus having a plurality of apertures arranged in series therein, and a particle measurement method using the same to statistically analyze multiple signals generated when a particle passes through the plurality of apertures, thus acquiring more accurate information on particles. The particle measurement apparatus includes a plurality of aperture members arranged in series, a plurality of electrodes to form an electric field within the plurality of aperture members, and an analyzer for statistically analyzing multiple electrical signals generated when a particle passes through the plurality of aperture members. |
