发明名称 METHOD FOR FAULT DIAGNOSIS OF A MEASURING INSTRUMENT
摘要 PURPOSE: A method for deciding the malfunction of a measuring device is provided to always monitor the existence of the malfunction of a measuring device and to manage products to maintain a quality over a predetermined level by using reliable measurement data of the measuring device. CONSTITUTION: A method for deciding the malfunction of a measuring device is as follows. New measurement data of a measuring device with respect to a current measurement object is collected. Past measurement data with respect to a past measurement object which is the same kind and has the similar goal specification with the current measurement object is extracted from measurement history data of the measuring device. The similarity between the collected new measurement data and extracted past measurement data is evaluated by comparing patterns.
申请公布号 KR20120075657(A) 申请公布日期 2012.07.09
申请号 KR20100137402 申请日期 2010.12.29
申请人 RESEARCH INSTITUTE OF INDUSTRIAL SCIENCE & TECHNOLOGY 发明人 KIM, JONG HAN
分类号 G01D18/00;G01D9/00 主分类号 G01D18/00
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