发明名称 |
Production Integrated Circuit Test Handler Using Microcontroller Reading a Thermal Diode of a Device Under Test for Temperature Control |
摘要 |
Production test of integrated circuit face thermal management challenges with higher power devices. Current production handlers do not have adequate thermal management characteristics. This invention employs thermal diodes on each device under test and a closed loop microprocessor controlled feedback system for thermal control during production test. |
申请公布号 |
US2012169363(A1) |
申请公布日期 |
2012.07.05 |
申请号 |
US201213343866 |
申请日期 |
2012.01.05 |
申请人 |
MAYFIELD JOSEPH SHELTON;RILEY NOLAN;TURNER CHAD;SANCHEZ ANGELO;TEXAS INSTRUMENTS INCORPORATED |
发明人 |
MAYFIELD JOSEPH SHELTON;RILEY NOLAN;TURNER CHAD;SANCHEZ ANGELO |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|