发明名称 SURFACE INSPECTION DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To stably detect a flaw on an object to be inspected even when the traveling speed of the object to be inspected is largely changed. <P>SOLUTION: A surface inspection device includes a line sensor camera 1 for receiving light reflected from a moving object to be inspected 2, an imaging signal buffer 6 for temporarily storing an imaging signal output from the line sensor camera 1 at a constant cycle, a rotary encoder 9 for detecting a moving distance of the object to be inspected 2, an image capture control unit 8b for performing control of reading out the imaging signal temporarily stored in the imaging signal buffer 6 when the moving distance of the object to be inspected 2 detected by the rotary encoder 9 reaches a predetermined distance, and a flaw detection portion for detecting a flaw candidate point on the surface of the object to be inspected 2 from the imaging signal read out from the imaging signal buffer 6. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012127941(A) 申请公布日期 2012.07.05
申请号 JP20110241297 申请日期 2011.11.02
申请人 JFE STEEL CORP 发明人 OSHIGE TAKAHIKO
分类号 G01N21/88;G01N21/892 主分类号 G01N21/88
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