发明名称 |
BASE MATERIAL PROCESSING METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a base material processing method capable of forming a thin film of uniform film thickness having excellent adhesion between a support base material and a base material using a temporarily fixing agent when temporarily fixing the base material onto the support base material and processing the base material and resultantly processing a base material with excellent accuracy. <P>SOLUTION: A base material processing method comprises: a first step of supplying a temporarily fixing agent to one surface of a support base material 1 in a spin coating method and forming a sacrificial layer (thin film) 2 by drying the temporarily fixing agent; a second step of bonding a semiconductor wafer 3 and the support base material 1 via the sacrificial layer 2; a third step of processing a surface on the side opposite to a functional surface 31 of the semiconductor wafer 3; and a fourth step of detaching the semiconductor wafer 3 from the support base material 1 by thermally decomposing a resin component by heating the sacrificial layer 2. The support base material 1 is set so that an affinity to the temporarily fixing agent almost equals an affinity to the temporarily fixing agent of the functional surface 31. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012129328(A) |
申请公布日期 |
2012.07.05 |
申请号 |
JP20100278686 |
申请日期 |
2010.12.14 |
申请人 |
SUMITOMO BAKELITE CO LTD |
发明人 |
TAKEUCHI ETSU;SUGIYAMA HIROMICHI;SATO TOSHIHIRO;KUBOYAMA TOSHIHARU;KUSUKI JUNYA;KAWADA MASAKAZU |
分类号 |
H01L21/683;H01L21/02;H01L21/027;H01L21/304;H01L21/306;H01L21/467 |
主分类号 |
H01L21/683 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|