发明名称 Nonvolatile semiconductor memory device
摘要 According to one embodiment, a nonvolatile semiconductor memory device includes a semiconductor substrate including a first region in which a memory cell transistor is arranged, a second region in which an electrode that extracts a word line electrically connected to the memory cell transistor is arranged, and a third region in which a peripheral transistor is arranged, the semiconductor substrate including an element isolation layer which separates adjacent active regions, first active regions provided in the first region and each having a first width, second active regions provided in the second region and each having a second width greater than the first width, third active regions provided in the third region and each having a third with greater than the first width. An upper surface of an element isolation layer in the second region is higher than that of an element isolation layer in the first region.
申请公布号 US8212303(B2) 申请公布日期 2012.07.03
申请号 US20100821689 申请日期 2010.06.23
申请人 SAKAMOTO WATARU;KABUSHIKI KAISHA TOSHIBA 发明人 SAKAMOTO WATARU
分类号 H01L29/94 主分类号 H01L29/94
代理机构 代理人
主权项
地址