发明名称 TESTER AND TEST SYSTEM INCLUDING THE SAME
摘要 PURPOSE: A tester and a test system including the same are provided to simultaneously test different types of semiconductors through a self-test using a memory controller and test program. CONSTITUTION: A host(300) is a general computer, a personal computer, or a work station embedded with an operating system and various application software. Testers(100a,100b,100c) are connected to the host and can communicate with the host at the same time. The host transmits test requests to the testers and receives test results and/or test finish signals. The testers include memory controllers(110a,110b,110c), connection units(120a,120b,120c), and contact units(130a,130b,130c).
申请公布号 KR20120069404(A) 申请公布日期 2012.06.28
申请号 KR20100130941 申请日期 2010.12.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, CHANG HWAN
分类号 G01R31/26 主分类号 G01R31/26
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