发明名称 STRAIN RELAXATION USING METAL MATERIALS AND RELATED STRUCTURES
摘要 Methods of fabricating semiconductor structures include forming a plurality of openings extending through a semiconductor material and at least partially through a metal material and deforming the metal material to relax a remaining portion of the semiconductor material. The metal material may be deformed exposing the metal material to a temperature sufficient it to alter (i.e., increase) its ductility. The metal material may be formed from one or more of hafnium, zirconium, yttrium and a metallic glass. Another semiconductor material may be deposited over the remaining portions of the semiconductor material, and a portion the metal material may be removed from between each of the remaining portions of the semiconductor material. Semiconductor structures may be formed using such methods.
申请公布号 WO2012085219(A1) 申请公布日期 2012.06.28
申请号 WO2011EP73816 申请日期 2011.12.22
申请人 SOITEC;WERKHOVEN, CHRISTIAAN J. 发明人 WERKHOVEN, CHRISTIAAN J.
分类号 H01L21/02 主分类号 H01L21/02
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