发明名称 |
METHOD FOR FABRICATING STORAGE NODE OF CAPACITOR AND SEMICONDUCTOR INCLUDING THE SAME |
摘要 |
PURPOSE: A semiconductor device and a method for forming a storage node of a capacitor are provided to control the increase of capacitance of a bit line by preventing a short circuit between a bit line and a guard. CONSTITUTION: An insulating layer(120) is formed on a semiconductor substrate(100) including a cell region, a peripheral region, and a border region. A storage node connection contact connected to the cell region of the semiconductor substrate by passing through the insulating layer is formed. A mold layer(150) is formed on the storage node connection contact and the insulating layer. A first opening unit exposing the storage node connection contact is formed. A second opening unit exposing the insulating layer is formed. Storage nodes are connected with the storage node connection contact. A guard(220) is composed of a same material layer with the storage nodes.
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申请公布号 |
KR20120067678(A) |
申请公布日期 |
2012.06.26 |
申请号 |
KR20100129214 |
申请日期 |
2010.12.16 |
申请人 |
SK HYNIX INC. |
发明人 |
KIM, JUN DONG;JUNG, SANG JAE |
分类号 |
H01L21/8242;H01L27/108 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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