发明名称 METHOD FOR FABRICATING STORAGE NODE OF CAPACITOR AND SEMICONDUCTOR INCLUDING THE SAME
摘要 PURPOSE: A semiconductor device and a method for forming a storage node of a capacitor are provided to control the increase of capacitance of a bit line by preventing a short circuit between a bit line and a guard. CONSTITUTION: An insulating layer(120) is formed on a semiconductor substrate(100) including a cell region, a peripheral region, and a border region. A storage node connection contact connected to the cell region of the semiconductor substrate by passing through the insulating layer is formed. A mold layer(150) is formed on the storage node connection contact and the insulating layer. A first opening unit exposing the storage node connection contact is formed. A second opening unit exposing the insulating layer is formed. Storage nodes are connected with the storage node connection contact. A guard(220) is composed of a same material layer with the storage nodes.
申请公布号 KR20120067678(A) 申请公布日期 2012.06.26
申请号 KR20100129214 申请日期 2010.12.16
申请人 SK HYNIX INC. 发明人 KIM, JUN DONG;JUNG, SANG JAE
分类号 H01L21/8242;H01L27/108 主分类号 H01L21/8242
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