发明名称 INSPECTION FIXTURE, INSPECTION PROBE
摘要 The present invention provides an inspection fixture and a contact. The inspection switch which can cope with miniaturization and complication of a substrate and is provided with a switch with component-reduced simplified structure for four-terminal inspection is provided. The inspection fixture is characterized by comprising the following components: a conductive cylindrical first cylinder which has an upper end that is jointed with an electrode part through pressure joint; a conductive cylindrical second cylinder which projects from a lower opening of the first cylinder, is coaxially configured in the first cylinder with an electrical connection mode and has a lower end that is jointed with an inspection point through pressure joint; and a conductive cylindrical third cylinder which is not electrically connected with the first cylinder and the second cylinder, is electrically accommodated in the first cylinder and the second cylinder and comprises an upper end that is jointed with the electrode part through pressure joint and a lower end that is jointed with the inspection point through pressure joint. The first cylinder is provided with a spiral first incision part at a cylinder wall part between the upper end and the lower end of the first cylinder. The first cylinder is also provided with a first fixed part which is fixed with a second cylinder at a position that is next to the lower end compared with the first incision part.
申请公布号 KR101157879(B1) 申请公布日期 2012.06.22
申请号 KR20100101825 申请日期 2010.10.19
申请人 发明人
分类号 G01R1/067;G01R1/02 主分类号 G01R1/067
代理机构 代理人
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