| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a force compensated probe for tools of measuring electrical impedance of insulators, allowing evaluation independent of an amount of mechanical force applied by the tools. <P>SOLUTION: A force compensated probe 10 includes a support structure having a back plate 21 and sidewalls 22, a probe 30 for electrical measurement of an article, and an elastic base 40 disposed to supportively couple the probe 30 to the back plate 21 such that the probe 30 normally protrudes away from the back plate 21 beyond distal edges of the sidewalls 22. When the probe 30 is applied to the article for the electrical measurement such that the components of the support structure contact the article, a predefined load is consistently applied to the elastic base 40. <P>COPYRIGHT: (C)2012,JPO&INPIT |
